EddyCus® TF map 2525SR
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Efficient Tes�ng Solu�ons EddyCus® TF map 2525SR – Sheet Resistance Imaging Device Device Series Contact-free imaging High resolu�on imaging (25 to Sheet resistance (Ohm/sq) Defect imaging Conduc�vity / resis�vity (mOhm cm) Mapping of encapsulated layers Electrical anisotropy (%) Weight (g/m²) and drying status (%) Architectural glass (LowE) Touch screens and flat monitors Nanowire films Smart-glass applica�ons Transparent an�sta�c foils Printed films Conduc�ve polymers (PEDOT:PSS) Other conduc�ve films and materials De-icing and hea�ng applica�ons Ba�eries and fuel cells Packaging materials Visit us at: www.suragus.com www.suragus.com/calculator www.suragus.com/EddyCusMap2525 Conduc�ve oxides Metal films and meshes

EddyCus® TF map 2525SR – Sheet Resistance Imaging Device Measurement technology Non-contact eddy current sensor Foils, glass, wafer, etc. 10 inch / 254 mm x 254 mm (larger upon request) Edge effect correc�on / exclusion 2 – 10 mm (depending on size, range, setup and requirements) Max. sample thickness / sensor gap 3 / 5 / 10 / 15 mm (defined by the thickest sample) Thickness measurement of metal films (e.g. aluminum, copper) 2 nm – 2 mm (in accordance with sheet resistance) Scanning pitch 1 / 2 / 5 / 10 mm (other upon request) Measurement points per �me (square shaped samples) 100...