EddyCus® TF map 2525SR

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EddyCus® TF map 2525SR

Product catalog summary

Applications

Contact-free imaging
High resolution imaging (25 to 1,000,000 points)
Defect imaging
Mapping of encapsulated layers
Architectural glass (LowE), touch screens, flat monitors
OLED, LED, smart-glass applications
Transparent antistatic foils, photovoltaics, semiconductors
De-icing, heating applications, batteries, fuel cells
Packaging materials

Device Series and Materials

Metal thickness (nm, µm), sheet resistance (Ohm/sq), emissivity
Conductivity/resistivity (mOhm cm), electrical anisotropy (%)
Weight (g/m²), drying status (%), permeability (H/m) Beta
Materials: Metal films, conductive oxides, nanowire films, graphene, CNT, graphite, printed films, conductive polymers (PEDOT:PSS)

Device Control and Software

Non-contact eddy current sensor
Substrates: Foils, glass, wafer
Max. scanning area: 10 inch / 254 mm x 254 mm
Edge effect correction/exclusion: 2 – 10 mm
Max. sample thickness/sensor gap: 3 / 5 / 10 / 15 mm
Thickness measurement of metal films: 2 nm – 2 mm
Scanning pitch: 1 / 2 / 5 / 10 mm
Measurement points per time: 100 in 0.5 minutes, 10,000 in 3 minutes
Scanning time: 4 inch in 0.5 to 3 minutes, 8 inch in 1.5 to 15 minutes
Device dimensions/weight: 23.6" x 9.05" x 31.5" / 27 kg

Software Features

Pre-defined measurement and product recipes
Line scan, histogram, area analysis
Black and colored image coding
CSV & PDF export, SPC summary and export
3 user levels, material database for parameter conversion
Edge effect compensation, storage and import of data
Export of data sets to EddyEva, MS Excel, Origin

Measurement Ranges and Accuracy

VLSR (Very Low Sheet Resistance): 0.0001 – 0.1 Ohm/sq, Accuracy ± 1%
LSR (Low Sheet Resistance): 0.01 – 10 Ohm/sq, Accuracy ± 1 – 2%
MSR (Medium Sheet Resistance): 0.1 – 100 Ohm/sq, Accuracy ± 1 – 3%
Repeatability (2σ): VLSR < 0.5%, LSR < 1%

Catalog excerpts

Efficient Tes�ng Solu�ons EddyCus® TF map 2525SR – Sheet Resistance Imaging Device Device Series Contact-free imaging High resolu�on imaging (25 to Sheet resistance (Ohm/sq) Defect imaging Conduc�vity / resis�vity (mOhm cm) Mapping of encapsulated layers Electrical anisotropy (%) Weight (g/m²) and drying status (%) Architectural glass (LowE) Touch screens and flat monitors Nanowire films Smart-glass applica�ons Transparent an�sta�c foils Printed films Conduc�ve polymers (PEDOT:PSS) Other conduc�ve films and materials De-icing and hea�ng applica�ons Ba�eries and fuel cells Packaging materials Visit us at: www.suragus.com www.suragus.com/calculator www.suragus.com/EddyCusMap2525 Conduc�ve oxides Metal films and meshes

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EddyCus® TF map 2525SR – Sheet Resistance Imaging Device Measurement technology Non-contact eddy current sensor Foils, glass, wafer, etc. 10 inch / 254 mm x 254 mm (larger upon request) Edge effect correc�on / exclusion 2 – 10 mm (depending on size, range, setup and requirements) Max. sample thickness / sensor gap 3 / 5 / 10 / 15 mm (defined by the thickest sample) Thickness measurement of metal films (e.g. aluminum, copper) 2 nm – 2 mm (in accordance with sheet resistance) Scanning pitch 1 / 2 / 5 / 10 mm (other upon request) Measurement points per �me (square shaped samples) 100 measurement...

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EddyCus® TF map 2525SR

EddyCus® TF map 2525SR

Catalog excerpts

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