EddyCus® TF lab 4040SR

Product catalog summary

Overview: The EddyCus® TF lab 4040SR is a sheet resistance tester designed for efficient and accurate testing solutions. It offers contact-free, real-time measurements and is capable of characterizing multilayer materials. The device is engineered and made in Germany by SURAGUS GmbH.

Applications: The tester is suitable for a wide range of applications including architectural glass, touch screens, OLED and LED applications, smart-glass, photovoltaics, semiconductors, de-icing and heating applications, batteries, fuel cells, packaging materials, metal films, conductive oxides, nanowire films, graphene, CNT, graphite, printed films, and conductive polymers.

Specifications:

Measurement Technology: Non-contact eddy current sensor
Substrates: Foils, glass, wafer, etc.
Substrate Area: 750 mm x 650 mm
Max Sample Thickness/Sensor Gap: 3 / 5 / 10 / 25 mm
Thickness Measurement Range: 2 nm – 2 mm
Device Dimensions/Weight: 760 mm x 310 mm x 660 mm / 20 kg

Measurement Capabilities:

Metal Thickness (nm, µm)
Sheet Resistance (Ohm/sq)
Emissivity
Conductivity/Resistivity (mOhm cm)
Electrical Anisotropy (%)
Weight (g/m²) and Drying Status (%)
Permeability (H/m) Beta
Optical Transmittance, Reflectance, Haze (%)

Device Control and Software: The device is controlled by easy-to-handle software that guides manual mapping of sheet resistance.

Performance: The device can measure six decades of sheet resistance with varying accuracy and repeatability.

Range [Ohm/sq]: 0.0001 – 200,000
Accuracy/Bias: ± 1% to ± 3 – 5%
Repeatability (2σ): < 0.3% to < 0.5%

Contact Information: For further questions, contact SURAGUS GmbH at +49 351 32 111 520 or visit their website at www.suragus.com.

Catalog excerpts

Efficient Tes�ng Solu�ons EddyCus® TF lab 4040SR – Sheet Resistance Tester Device Series Accurate single-point measurement Sheet resistance (Ohm/sq) materials upon request Conduc�vity / resis�vity (mOhm cm) Manual mapping of sheet resistance Electrical anisotropy (%) guided by easy-to-handle so�ware Weight (g/m²) and drying status (%) Op�cal transmi�ance, reflectance, Architectural glass (LowE) Touch screens and flat monitors Nanowire films Smart-glass applica�ons Transparent an�sta�c foils Printed films Conduc�ve polymers (PEDOT:PSS) Other conduc�ve films and materials De-icing and hea�ng applica�ons Ba�eries and fuel cells Packaging materials Visit us at: www.suragus.com www.suragus.com/calculator www.suragus.com/EddyCusLab4040 Conduc�ve oxides

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EddyCus® TF lab 4040SR – Sheet Resistance Tester Measurement technology Non-contact eddy current sensor Foils, glass, wafer, etc. Substrate area Max. sample thickness/ sensor gap 3 / 5 / 10 / 25 mm (defined by the thickest sample) Thickness measurement range of metal films (e.g. copper) 2 nm – 2 mm (in accordance with sheet resistance) Device dimensions (w/h/d) / weight Further available features Sheet resistance measurement, Metal thickness tester, Anisotropy sensor , Op�cal transmi�ance, reflectance, haze VLSR 6 decades are measurable by one sensor, but with slightly affected accuracy Range...

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EddyCus® TF lab 4040SR

EddyCus® TF lab 4040SR

Catalog excerpts

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