EddyCus® TF lab 4040SR
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Efficient Tes�ng Solu�ons EddyCus® TF lab 4040SR – Sheet Resistance Tester Device Series Accurate single-point measurement Sheet resistance (Ohm/sq) materials upon request Conduc�vity / resis�vity (mOhm cm) Manual mapping of sheet resistance Electrical anisotropy (%) guided by easy-to-handle so�ware Weight (g/m²) and drying status (%) Op�cal transmi�ance, reflectance, Architectural glass (LowE) Touch screens and flat monitors Nanowire films Smart-glass applica�ons Transparent an�sta�c foils Printed films Conduc�ve polymers (PEDOT:PSS) Other conduc�ve films and materials De-icing and hea�ng applica�ons Ba�eries and fuel cells Packaging materials Visit us at: www.suragus.com www.suragus.com/calculator www.suragus.com/EddyCusLab4040 Conduc�ve oxides

EddyCus® TF lab 4040SR – Sheet Resistance Tester Measurement technology Non-contact eddy current sensor Foils, glass, wafer, etc. Substrate area Max. sample thickness/ sensor gap 3 / 5 / 10 / 25 mm (defined by the thickest sample) Thickness measurement range of metal films (e.g. copper) 2 nm – 2 mm (in accordance with sheet resistance) Device dimensions (w/h/d) / weight Further available features Sheet resistance measurement, Metal thickness tester, Anisotropy sensor , Op�cal transmi�ance, reflectance, haze VLSR 6 decades are measurable by one sensor, but with slightly affected accuracy...