EddyCus® TF lab 4040
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Quragus Sensors & Instruments Non-Contact Sheet Resistance Tester APPLICATIONS > Architectural glass (LowE) > Touch screens & flat monitors > OLED & LED applications > Smart-glass applications > Transparent antistatic foils > Photovoltaics > Semiconductors > De-icing & heating applications > Batteries & fuel cells > Packaging materials ■ Contact-free & real-time ■ Accurate single-point measurement of sheet resistance for conductive thin films (Ohm/sq) ■ Layer thickness measurement of metal films (nm) ■ Layer and substrate thickness monitoring (pm) ■ Characterization of multilayer systems on request ■ Manual mapping of sheet resistance guided by an easy-to-handle software

DATA SHEET EddyCus® TF lab 4040 series – Sheet Resistance Tester EddyCus® TF lab 4040 series Sheet resistance measurement technology e.g. foil, glass and wafer 29.5 x 25.6 inch/ 750 x 650 mm (for measurement of 16 inch / 400 x 400 mm samples) Substrate area Max. sample thickness/sensor gap (defines distances) Sheet resistance range Thickness measurement of thin films (e.g. copper) Device dimension (w/h/d) Weight Available features Non-contact eddy current sensor 1 /2 / 5 / 10/ 25 mm (defined by the thickest sample/application) 2 nm – 2 mm (in accordance with sheet resistance) 30 x 12 x 26...