EddyCus® TF lab 4040

Product catalog summary

Overview
The EddyCus® TF lab 4040 series is a non-contact sheet resistance tester designed for efficient testing of conductive thin films. It is suitable for a variety of applications including architectural glass, touch screens, OLEDs, photovoltaics, semiconductors, and more.

Key Features

Contact-free and real-time measurement.
Accurate single-point measurement of sheet resistance (Ohm/sq).
Layer thickness measurement for metal films (nm) and substrate thickness monitoring (µm).
Characterization of multilayer systems available upon request.
Manual mapping of sheet resistance with user-friendly software.

Technical Specifications

Measurement Technology: Non-contact eddy current sensor.
Substrates: Suitable for foil, glass, and wafer.
Substrate Area: 29.5 x 25.6 inch / 750 x 650 mm.
Sample Thickness/Sensor Gap: Ranges from 1 to 25 mm.
Sheet Resistance Range: 0.0001 – 3,000 Ohm/sq with varying accuracy and repeatability.
Thickness Measurement: 2 nm – 2 mm for thin films.
Device Dimensions: 30 x 12 x 26 inch / 760 x 310 x 660 mm.
Weight: 20 kg.

Additional Features

Metal thickness measurement.
Sheet resistance anisotropy sensor.
Optical transparency measurement.

Software & Handling
The EddyCus® TF lab Control software facilitates easy handling and manual mapping of sheet resistance, enhancing user experience and measurement accuracy.

Catalog excerpts

Quragus Sensors & Instruments Non-Contact Sheet Resistance Tester APPLICATIONS > Architectural glass (LowE) > Touch screens & flat monitors > OLED & LED applications > Smart-glass applications > Transparent antistatic foils > Photovoltaics > Semiconductors > De-icing & heating applications > Batteries & fuel cells > Packaging materials ■ Contact-free & real-time ■ Accurate single-point measurement of sheet resistance for conductive thin films (Ohm/sq) ■ Layer thickness measurement of metal films (nm) ■ Layer and substrate thickness monitoring (pm) ■ Characterization of multilayer systems on request ■ Manual mapping of sheet resistance guided by an easy-to-handle software

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DATA SHEET EddyCus® TF lab 4040 series – Sheet Resistance Tester EddyCus® TF lab 4040 series Sheet resistance measurement technology e.g. foil, glass and wafer 29.5 x 25.6 inch/ 750 x 650 mm (for measurement of 16 inch / 400 x 400 mm samples) Substrate area Max. sample thickness/sensor gap (defines distances) Sheet resistance range Thickness measurement of thin films (e.g. copper) Device dimension (w/h/d) Weight Available features Non-contact eddy current sensor 1 /2 / 5 / 10/ 25 mm (defined by the thickest sample/application) 2 nm – 2 mm (in accordance with sheet resistance) 30 x 12 x 26 inch...

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EddyCus® TF lab 4040

EddyCus® TF lab 4040

Catalog excerpts

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