EddyCus® TF lab 2020SR
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Efficient Tes�ng Solu�ons EddyCus® TF lab 2020SR – Sheet Resistance Tester Device Series Accurate single-point measurement Sheet resistance (Ohm/sq) Manual mapping guided by easy-to- handle so�ware Conduc�vity / resis�vity (mOhm cm) Measurement of encapsulated layers Electrical anisotropy (%) Weight (g/m²) and drying status (%) materials upon request Architectural glass (LowE) Touch screens and flat monitors Nanowire films Smart-glass applica�ons Transparent an�sta�c foils Printed films Conduc�ve polymers (PEDOT:PSS) Other conduc�ve films and materials De-icing and hea�ng applica�ons Ba�eries and fuel cells Packaging materials Visit us at: www.suragus.com www.suragus.com/calculator www.suragus.com/EddyCusLab2020 Conduc�ve oxides

EddyCus® TF lab 2020SR – Sheet Resistance Tester Measurement technology Non-contact eddy current sensor Foils, glass, wafer, etc. Substrate area 8 inch / 204 mm x 204 mm (open on three sides) Max. sample thickness / sensor gap 3 / 5 / 10 / 25 mm (defined by the thickest sample) Thickness measurement range of metal films (e.g. copper) 2 nm – 2 mm (in accordance with sheet resistance) Device dimensions (w/h/d) / weight Further available features Sheet resistance measurement / metal thickness monitor VLSR 6 decades are measurable by one sensor, but with slightly affected accuracy Range...