EddyCus® TF lab 2020

Product catalog summary

Overview
The document provides details about the EddyCus® TF lab 2020 series, a non-contact sheet resistance tester developed by SURAGUS GmbH. It highlights the device's applications, features, and technical specifications.

Applications
The tester is suitable for a variety of applications including architectural glass (LowE), touch screens, OLED & LED applications, smart-glass, transparent antistatic foils, photovoltaics, semiconductors, de-icing & heating applications, batteries & fuel cells, and packaging materials.

Key Features

Contact-free and real-time measurement capabilities.
Accurate single-point measurement of sheet resistance for conductive thin films (Ohm/sq).
Layer thickness measurement of metal films (nm).
Layer and substrate thickness monitoring (µm).
Characterization of multilayer systems available upon request.
Manual mapping of sheet resistance facilitated by user-friendly software.

Technical Specifications

Non-contact eddy current sensor suitable for substrates like foil, glass, and wafers.
Substrate area: 8 inch / 204 x 204 mm, open to three sides.
Maximum sample thickness/sensor gap: 1 / 2 / 5 / 10 / 25 mm.
Sheet resistance range: 0.0001 – 3,000 Ohm/sq with varying accuracy and repeatability.
Thickness measurement range for metal films: 2 nm – 2 mm.
Device dimensions: 11.4 x 17.5 x 5.5 inch / 290 x 445 x 140 mm.
Weight: 10 kg.

Contact Information
For further inquiries, contact SURAGUS GmbH at [email protected] or phone +49 (0) 351 32 111 520.

Catalog excerpts

Efficient Testing Solutions Quragus Sensors & Instruments Non-Contact Sheet Resistance Tester DATA SHEET - EddyCus® TF lab 2020 series APPLICATIONS > Architectural glass (LowE) > Touch screens & flat monitors > OLED & LED applications > Smart-glass applications > Transparent antistatic foils > Photovoltaics > Semiconductors > De-icing & heating applications > Batteries & fuel cells > Packaging materials ■ Contact-free & real-time ■ Accurate single-point measurement of sheet resistance for conductive thin films (Ohm/sq) ■ Layer thickness measurement of metal films (nm) ■ Layer and substrate thickness monitoring (pm) ■ Characterization of multilayer systems on request ■ Manual mapping of sheet resistance guided by an easy-to-handle software

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EddyCus® TF lab 2020 series Sheet resistance measurement technology Substrates Substrate area Non-contact eddy current sensor e.g. foil, glass, wafer, etc. 8 inch / 204 x 204 mm (open to three sides) Max. sample thickness/sensor gap(defines distances) 1 / 2 / 5 / 10 / 25 mm (defined by the thickest sample / application) Sheet resistance range Thickness measurement range of metal films (e.g. Cu, Al) Device dimension (w/h/d) Weight Available future Sheet resistance measurement / metal thickness tester SOFTWARE & HANDLING - EddyCus® TF lab Control EddyCus® TF lab Control File Measurement Info...

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EddyCus® TF lab 2020

EddyCus® TF lab 2020

Catalog excerpts

All SURAGUS GMBH catalogs and technical brochures