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BW-H501

BW-H501

BW-H501

Product catalog summary
Overview: This document provides detailed specifications and features of the NIKON LV100D-U optical microscope unit and associated components, including the Focuscope FCV100C controller, Dell P390 computer, and BridgeElements software. It highlights the capabilities of the system in high-speed 3D surface profiling and image processing.
Specifications:
  • Microscope Unit: LV100D-U with a two-beam interference objective lens, standard configuration at 20x magnification, with options for 2.5x to 100x.
  • Measurement Range: Horizontal and vertical ranges from 3160 μm to 79 μm, depending on magnification.
  • Working Distance: Ranges from 10.3 mm to 2.0 mm.
  • Numerical Aperture (NA): Varies from 0.075 to 0.7.
  • Height Measurement: Effective resolution of 0.1 μm, reproductive accuracy of σ = 0.01 μm.
System Components:
  • High-Speed 3D Surface Profiler: BW-H501, capable of high-speed image acquisition and real-time height observation.
  • Image Processing Software: BridgeElements X-Cycle Imager for image correction, roughness index calculation, and 3D display.
  • Illumination and Vibration Isolation: High-brightness illuminator MAX-F310 and active vibration isolation table TS-150.
Features:
  • High-Speed Image Processing: Real-time height image display at 5 frames per second, with high-speed camera capturing at 900 frames per second.
  • Advanced Image Correction: Includes plane and quartic curve correction for accurate surface analysis.
  • Output and Display: Processed images and roughness indices can be output to Excel files, with 3D display capabilities using MS Direct X.
Applications: Suitable for analyzing surface roughness of metallic and non-metallic materials, including ceramics and diffusive surfaces, with high precision and repeatability.
Additional Information: The document notes that specifications are subject to change and highlights export control regulations. It provides contact information for NIKON offices worldwide.
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Catalog excerpts

BW-H501-1

High Speed 3D Surface Profiler BW-H501 ■ System DiagramSupport for a range of microscopes CM Series compact microscope AZ Series multi-purpose zoom microscope Focuscope image processor made by Photron BridgeElements X-Cycle Imager image processing software Height measurement time High Speed 3D Surface Profiler *1: Requires a high-brightness illuminator *2: Smallest observable height difference *3: Resolution on indication cannot be given because it uses floating point (32-bit) numbers Option Parts High-brightness illuminator BW-H501 Specifications and equipment are subject to change without any notice or obligation on the part of the manufacturer. December 2008 ©2008 NIKON CORPORATION The products detailed in the brochure are controlled by the Japanese Foreign Exchange and Foreign Trade Law and the International Export Control Regime. If there is a possibility that they may be utilized for the development of weapons of mass destruction, etc., they shall not be exported without authorization from the government. Manufactured by Technotools Corporation A WARNING TO ENSURE CORRECT USAGE, READ THE CORRESPONDING MANUALS CAREFULLY BEFORE USING THE EQUIPMENT. NIKON CORPORATION 6-3, Nishiohi 1-chome, Shinagawa-ku, Tokyo 140-8601, Japan phone: +81-3-3773-9026 fax: +81-3-3773-9062 http://nikon.com/products/instruments/index.htm NIKON INSTRUMENTS INC. 1300 Walt Whitman Road, Melville, N.Y. 11747-3064, U.S.A. phone: +1-631-547-8500; +1-800-52-NIKON (within the U.S.A. only) fax: +1-631-547-0306 http://www.nikoninstruments.com/ NIKON INSTRUMENTS EUROPE B.V. Laan van Kronenburg 2, 1183 AS, Amstelveen, The Netherlands phone: +31-20-44-96-222 fax: +31-20-44-96-298 http://www.nikoninstruments.eu/ NIKON INSTRUMENTS (SHANGHAI) CO., LTD. CHINA phone: +86-21-5836-0050 fax: +86-21-5836-0030 (Beijing branch) phone: +86-10-5869-2255 fax: +86-10-5869-2277 (Guangzhou branch) phone: +86-20-3882-0552 fax: +86-20-3882-0580 NIKON SINGAPORE PTE LTD. SINGAPORE phone: +65-6559-3618 fax: +65-6559-3668 NIKON MALAYSIA SDN. BHD. MALAYSIA phone: +60-3-78763887 fax: +60-3-78763387 NIKON INSTRUMENTS KOREA CO., LTD. KOREA phone: +82-2-2186-8410 fax: +82-2-555-4415 NIKON CANADA INC. CANADA phone: +1-905-625-9910 fax: +1-905-625-0103 NIKON FRANCE S.A.S. FRANCE phone: +33-1-45-16-45-16 fax: +33-1-45-16-00-33 NIKON GMBH GERMANY phone: +49-211-9414-0 fax: +49-211-9414-322 NIKON INSTRUMENTS S.p.A. ITALY phone: +39-55-3009601 fax: +39-55-300993 NIKON AG SWITZERLAND phone: +41-43-277-2860 fax: +41-43-277-2861 Code No. 2CE-KGWH-1 NIKON UK LTD. UNITED KINGDOM phone: +44-20-8541-4440 fax: +44-20-8541-4584 NIKON GMBH AUSTRIA AUSTRIA phone: +43-1-972-6111-00 fax: +43-1-972-6111-40 NIKON BELUX BELGIUM phone: +32-2-705-56-65 fax: +32-2-726-66-45

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BW-H501-2

X-cycle leads the way to a new world of optical microscopy Piezo actuator + High-speed camera = X-cycle high-speed image acquisition Enables real-time height observation With the X-cycle method, an objective lens performs cyclical scans, while the optical images generated are captured by a highspeed camera. Height images are calculated at high speed and displayed in real time. Real-time height image High-speed display of height images at 5 frames per second. The heating stage allows you to observe and analyze the deformation process of film and gel samples in real time. High-speed camera Optical...

 Open the catalog to page 2

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*Prices are pre-tax. They exclude delivery charges and customs duties and do not include additional charges for installation or activation options. Prices are indicative only and may vary by country, with changes to the cost of raw materials and exchange rates.