PRODUCT FLYER PXI Source Measure Units CONTENTS PXI System Source Measure Units PXI Multichannel Source Measure Units Platform-Based Approach to Test and Measurement PXI Instrumentation Hardware Services NATIONAL ^INSTRUMENTS Page 1 | ni.com | PXI Source Measure Units

PXI System Source Measure Units PXIe-4135, PXIe-4136, PXIe-4137, PXIe-4138, and PXIe-4139 • Software: Includes interactive soft front panel, API support for LabVIEW and text-based languages, shipping examples, and detailed help files • SourceAdapt digital control loop technology • Four-quadrant source and measure capability • High-speed update rate up to 100 kS/s • Current sensitivity down to 10 fA • Hardware timing and triggering • High-speed sampling rate up to 1.8 MS/s Built for Automated Test and Measurement NI’s source measure units (SMUs) are optimized for building automated test systems,...

Maximum Pulse Current (A) 3 Offset Accuracy, Tcal +/- 5 degrees (pA) 6 Offset Accuracy, Tcal +/- 1 degree (pA) 5 SourceAdapt Custom Transient Response • Programmable Output Resistance • 2nd Order Noise Rejection • Connectivity Triaxial High Voltage Safety Interlock • Screw Terminal Screw Terminal Screw Terminal Screw Terminal Detailed View of the PXIe-4137 Page 3 | ni.com | PXI Source Measure Units

Key Features Channel Density and Scalability SMU channel density is increasingly important for multi-site testing and for improving test throughput in applications like reliability that require inherently long stress and measurement cycles. The modularity of the PXI platform allows you to optimize the size of your test system and number of parallel SMU channels by choosing the appropriate chassis and instruments. In a single PXI chassis, you can add up to 17 system SMU channels, mix with higher density SMUs or switches, or combine with other types of instruments to build tightly integrated mixed...

High-Speed Measurement and Update Rate NI system SMUs can sample up to 1.8 MS/s and source up to 100 kS/s, which adds new functionality to a traditionally DC instrument. The high speed sampling rate allows you to use the SMU as a high voltage or current digitizer to capture transient behavior or monitor current consumption over time. The fast update rate allows you to step through large sequences very quickly or use the SMU to generate arbitrary waveforms at low frequencies. Since NI SMUs communicate and share data via a high bandwidth, low latency PCI express interface, you can use the full...

Extended Range Pulsing Certain NI system SMUs are capable of exceeding their 20 W DC power boundary and generating pulses up to 500 W. Generating short, high-power pulses allows you to test devices such as high-brightness LEDs and power transistors while minimizing heat dissipation in the DUT. Having a single device capable of sourcing or sinking up to 500 W reduces the need for stacking multiple SMUs in parallel, and generating short, accurate pulses reduces the need for thermal management systems. Figure 3. The PXIe-4139 can generate pulses up to 10 A with lengths between 50 µs and 1 ms NI-DCPOWER...

NI-DCPOWER Soft Front Panel The NI-DCPower driver software includes an interactive soft front panel for full out-of-the-box functionality. This interactive soft front panel includes two modes: one for constantly outputting a DC current or voltage, and another for performing one or two channel sweeps. In addition, you can enable a Debug Driver Session to monitor and debug the instrument during automated measurements. Page 7 | ni.com | PXI Source Measure Units

• Software: Includes interactive soft front panel, API support for LabVIEW and text-based languages, shipping examples, and detailed help files • Hardware timing and triggering • Four-quadrant source and measure capability • SourceAdapt digital control loop technology • High-speed sampling rate up to 600 kS/s • High-speed update rate up to 100 kS/s Built for Automated Test and Measurement NI’s source measure units (SMUs) are optimized for building automated test systems, with hardware features to reduce test execution time and tight software integration to reduce development effort. Built on...

Offset Accuracy, Tcal +/- 5 5 degrees (nA) Offset Accuracy, Tcal +/- 1 degree (nA) - Custom Transient Response - Programmable Output Resistance - 2nd Order Noise Rejection - • Connectivity DSUB DSUB DSUB DSUB DSUB 1 NI recommends the PXIe-1095, for use with the PXIe-4162 or PXIe-4163 SMUs to achieve full current output per channel. When used in other chassis capable of just 38 W power dissipation per slot, current output per channel becomes 60 mA and 30 mA for the PXIe-4162 and PXIe-4163, respectively. I/O connector including remote sense and guard _Timing and synchronization *...

Key Features Channel Density and Scalability SMU channel density is increasingly important for multi-site testing and for improving test throughput in applications like reliability that require inherently long stress and measurement cycles. The modularity of the PXI platform allows you to optimize the size of your test system and number of parallel SMU channels by choosing the appropriate chassis and instruments. In a single PXI chassis, you can add up to 408 parallel SMU channels or combine with other types of instruments to build tightly integrated mixed-signal test systems. For even larger...

High-Speed Measurement and Update Rate NI multichannel SMUs can sample up to 600 kS/s and source up to 100 kS/s, which adds new functionality to a traditionally DC instrument. The high-speed sampling rate allows you to use the SMU as a voltage or current digitizer to capture transient behavior or monitor current consumption over time. The fast update rate allows you to step through large sequences very quickly or use the SMU to generate arbitrary waveforms at low frequencies. Since NI SMUs communicate and share data via a high bandwidth, low latency PCI express interface, you can use the full...