TS323 Data Sheet
6Pages

GENASYS HIGH PERFORMANCE MIXED SIGNAL TEST SYSTEM PLATFORM • PXI-based architecture offers compact footprint, open architecture, and expandability • Hybrid and multiplexed pin capability supports testing of high value, mission critical products • Scalable architecture supports up to 4500 interface test points • Comprehensive tools for migrating LASAR based programs • Ideal for upgrading / replacing legacy Teradyne L200/L300, GenRad 2750 and VXI-based systems DESCRIPTION The TS-323 GENASYS platform is a PXI based test system designed to address a broad range of mil-aero and mission-critical products that require performance functional testing. The GENASYS offers best in class digital test capabilities which can effectively address the test needs associated with legacy ATE systems including the Teradyne L200/L300, GenRad 2750 and VXI-based digital systems. The TS-323 is available with range of digital and analog instrument options for addressing both LRU and SRU test needs as well as supporting depot and manufacturing test needs. The TS-323 switching subsystem supports "any resource to any pin" architecture and scalable architecture. FEATURES The TS-323's core system includes the GX5960 digital subsystem which offers best-in-class performance digital test capabilities. Featuring a 50 MHz vector rate, programmable voltage levels per pin, timing per pin and multiple time sets, the GX5960 subsystem provides all of the features necessary for complex functional testing or for legacy test program migration. Additionally, the GENASYS platform provides access to an analog bus, allowing each digital channel to have hybrid signal capability when configured with an analog switching matrix which provides any resource to any pin signal routing. For multiplexed pin configurations, the GENASYS can be configured with 1:16 multiplexer switch cards, providing over 4500 multiplexed pin connections to the UUT interface. The scalable architecture allows multiple configurations starting at 64 digital pins, and a mix of low frequency and high frequency switching channels with matrix, multiplexer, or Multi-Matrix topologies. Also included are system power supplies and environmental monitoring. A wide range of optional instrumentation and switching is available, allowing the GENASYS to be configured for a customer's specific needs. TS-323 Core System The core system includes the following features: • GX7005A 20-slot, PXI chassis with (19) 6U peripheral slots. • Switching subsystem with integrated MAC Panel SCOUT receiver • GX5960 high performance digital subsystem, providing 64 to 512 channels with per pin attribute programmability • External PC with Windows OS • 6% digit DMM • High density, 8000 I/O Scout receiver with integral direct access adapters, providing a reliable and high performance wireless interface from tester instrumentation to the tester's receiver interface. TS-323 Analog Instrument Options Various analog source and measure instrumentation options are available for the TS-323 system: • Dual-Channel Arbitrary Waveform Function Generator • Four Channel DSO • Two Channel Counter / Timer MARVIN TEST SOLUTIONS Toll Free: 888-TEST-BY-PXI • Phone: 949-263-2222 • Fax: 949-263-1203 • email: sales@marvintest.com • www.marvintest.com

TS-323 SERIES TS-323 Analog Switching Options The modular analog switching subsystem options for the TS-323 system include: • 16 channel, 1:12 100 MHz multiplexer • 16 channel, 1:16 hybrid pin multiplexer • 16 x32 matrix cards, supporting configurations up to 16 x 256 TS-323 User Supply and SMU Options Programmable user supply and SMU options include: • Agilent N6700 programmable power supply mainframe and DC modules • Keithley 2600 Source / Measure Units (SMUs), (single and dual channel) In addition, a wide range of 3rd party PXI, cPCI, and GPIB instruments can be integrated into the test...

Maximum Drive Level Range MANUFACTURING Copyright © Marvin Test Solutions, Inc. All rights reserved. Product and company names listes are trademarks of their respective companies. Revision D • Updated Jun 22, 2017

ANALOG INSTRUMENTATION MANUFACTURING Copyright © Marvin Test Solutions, Inc. All rights reserved. Product and company names listes are trademarks of their respective companies. Revision D • Updated Jun 22, 2017

Note: Specifications are subject to change without notice ORDERING INFORMATION MANUFACTURING Copyright © Marvin Test Solutions, Inc. All rights reserved. Product and company names listes are trademarks of their respective companies. Revision D • Updated Jun 22, 2017

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