Optical Crack Tracer
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Optical Crack Tracer - 1

Optical Crack Tracer System for Automatic Fracture Toughness Measurement by Optical Monitoring of Crack Propagation La Vi s i a N Fraunhofer Polymeric Materials and Composites

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Optical Crack Tracer - 2

Optical Crack Tracer Application LaVision Optical Crack Tracer (OCT) is a new generation of instruments for crack analysis. The OCT works on a wide range of different materials: ► Brittle and Toughened Resins ► Thermoplastic Polymers ► Adhesives, Components, Molding Resins ► Metals, Ceramics, Inorganic Glasses In combination with every standard Materials Testing Machine LaVision OCT tracks the crack optically during crack initiation and propagation and computes fully automatically the ► Critical Stress Intensity Factor Klc ► Strain Energy Release Rate Glc Fully Integrated Package In this...

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This example shows an almost constant Klc, that indicates the true material fracture toughness has been correctly determined by this test. Obviously, an ideal pre-crack has been formed, because fracture toughness is the same for crack initiation and propagation. ► l\lo additional sample preparation ► Automatic determination of Klc and Glc ► No subsequent manual analysis of the broken specimen required ► High accuracy, needs very few samples ► High reliability (for transparent and non-transparent samples) ► Complete measurement results (calculations, graphs, printouts) within a minute ► Easy...

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Optical Crack Tracer - 4

Specification Optical Crack Tracer CCD-camera: 768 x 576 pixel Time resolution: 10 Hz Resolution: typically 0.05 mm (observation window 25 mm) Error of crack length: < 0.1 mm Max. time of monitoring: ca. 2 min (depending of RAM in PC and image size) Advanced PC AD-converter TTL-I/O Framegrabber Stroboscope/lightning synchronisation Software: Win-NT DaVis-6 crack software package Interface to the material testing machine (analog force signal) Optional high-speed crack recording (100 Hz, 1kHz, 40 kHz) high-resolution CCD-cameras up to 2k x 2k pixel micro-crack detection with pm-resolution...

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