R&S®FS-K40
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Data sheet Application Firmware for Phase Noise Measurements R&S®FS-K40Phase noise measurements with Analyzers R&S®FSP/FSU/FSQ/FSMR ♦ Editable sweep settings: -Measurement range -Resolution bandwidths -Filter types (analog, digital, FFT) -Averaging -Smoothing factors ♦ Editable limit lines with pass/fail indication ♦ Fast residual FM/q>M measurements over settable frequency range ♦ Comprehensive marker functions ♦ Simultaneous display of up to three traces ♦ Storage of results and settings ♦ Remote control via GPIB or LAN

Application Firmware R&S®FS-K40 adds phase noise measurement capability to the Analyzers R&S®FSP/R&S®FSU/ R&S®FSQ/R&S®FSMR. Due to their very low inherent phase noise and low noise factor, the R&S®FSU, R&S®FSQ and the R&S®FSMR are ideal for applications that call for very high spectral purity, for example analyzing signal sources such as radio frequency chips used in the modern 3GPP communications standards. The high phase noise measurement speed is achieved through the high sweep rates of the Rohde & Schwarz analyzers. It is possible to trade off speed against accuracy at small...

Fig. 1: Setting of sweep parameters: The area with a green background on the left shows the currently selected offset frequency measurement range. The fields with a white background can be edited. Fig. 2: Setting of global parameters for phase noise measurements: The basic measurement parameters (carrier level and frequency, display ranges, etc), the residual FM/ϕM measurement range, as well as discrete offset frequencies of interest are entered here. Fig. 3: Phase noise measurement of a signal source: blue trace: original trace; yellow trace: trace with a smoothing factor of 5%. The red...

The maximum number of decades that can be represented in a phase noise diagram is determined by the user-definable carrier offset frequency range. Lower offset limit (inherent residual FM) Measurement accuracy The level measurement accuracy is mainly determined by the characteristics of the analyzer used. For relevant specifications refer to the corresponding data sheet (see "Related data sheets"). Inherent phase noise The measurement sensitivity is mainly determined by the analyzer's inherent phase noise. The diagrams opposite show the typical phase noise characteristics of the analyzers,...

Fig. 4: Typical SSB phase noise versus carrier offset frequency of Analyzers ¸FSU, ¸FSQ (from serial No. 2xx xxx) and ¸FSMR ¸FSU/FSQ/FSMR SSB phase noise in dBc (1 Hz) Carrier offset Fig. 5: Typical SSB phase noise versus carrier offset frequency of Spectrum Analyzer ¸FSP Carrier offset Ordering information Application Firmware for Phase Noise Measurements Related data sheets Spectrum Analyzers ¸FSP Spectrum Analyzers ¸FSU Signal Analyzers ¸FSQ Measuring Receiver ¸FSMR Application Firmwa

Certified Environmental System More information at www.rohde-schwarz.com (search term: FSP/FSU/FSQ/FSMR/FS-K40) Europe: Tel. +49 1805 12 4242, e-mail: customersupport@rohde-schwarz.com North America: Tel. 888 837 87 72, option 2 (from within the USA and Canada), +1 410-910-7800, option 2 (from other countries), e-mail: customer.support@rsa.rohde-schwarz.com Asia: Tel. +65 68463710, e-mail: customersupport.asia@rohde-schwarz.com ¸is a registered trademark of Rohde & Schwarz GmbH & Co. KG · Trade names are trademarks of the owners · Printed in Germany (Pe as) PD0758.2631.32 · ¸FS-K40 ·...